secondary ion mass spectrometry

noun

A technique used to visualize the three-dimensional structure of solids by employing an energetic ion beam to fragment the atomic or molecular constituents from a surface

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Meanings

nounsecondary ion mass spectrometry (uncountable, abbreviation SIMS)

abbreviation SIMS

  1. uncountablenatural sciencesA technique used to visualize the three-dimensional structure of solids by employing an energetic ion beam to fragment the atomic or molecular constituents from a surface
Cite this entry
APA

secondary ion mass spectrometry. (n.d.). In WatkinsX Dictionary. Retrieved November 5, 2026, from https://dictionary.watkinsx.com/word/secondary%20ion%20mass%20spectrometry

MLA

“secondary ion mass spectrometry.” WatkinsX Dictionary, https://dictionary.watkinsx.com/word/secondary%20ion%20mass%20spectrometry. Accessed November 5, 2026.

Chicago

WatkinsX Dictionary, s.v. “secondary ion mass spectrometry,” accessed November 5, 2026, https://dictionary.watkinsx.com/word/secondary%20ion%20mass%20spectrometry.

Source: secondary ion mass spectrometry on Wiktionary, CC BY-SA 4.0.